Evaluation of the nanotube intrinsic resistance across the tip-carbon nanotube-metal substrate junction by Atomic Force Microscopy

Maguy Dominiczak (1, 2) , Larissa Otubo (2) , David Alamarguy (1) , Frédéric Houzé (1) , Sebastian Volz (3) , Sophie Noël (1) , Jinbo Bai (2)

1 LGEP - Laboratoire de génie électrique de Paris
2 MSSMat - Laboratoire de mécanique des sols, structures et matériaux
3 EM2C - Laboratoire d'Énergétique Moléculaire et Macroscopique, Combustion

Mots clés: contact electrical resistance conductive probe atomic force microscopy; MWCNTs; multi-walled carbon nanotubes; NEMS; NRAMs; CVD; MWCNT

Domaines: Micro et nanotechnologies/Microélectronique; Sciences de l'information et de la communication

Maguy Dominiczak, Larissa Otubo, David Alamarguy, Frédéric Houzé, Sebastian Volz, et al.. Evaluation of the nanotube intrinsic resistance across the tip-carbon nanotube-metal substrate junction by Atomic Force Microscopy. Nanoscale Research Letters, 2011, 6, pp.335-347. ⟨10.1186/1556-276X-6-335⟩. ⟨halshs-00587572⟩